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58

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361

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9

h-index

7

i10-index

Yan Xie is an academic researcher from National Institute of Metrology. The author has contributed to research in topics: Spectroscopy and Laser Applications & Photonic and Optical Devices & Semiconductor Lasers and Optical Devices. The author has an h-index of 9, co-authored 50 publications.

ORCID: 0000-0002-8670-8864

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