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59

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1.2K

Citations

16

h-index

20

i10-index

Byong Chon Park is an academic researcher from Korea Research Institute of Standards and Science. The author has contributed to research in topics: Force Microscopy Techniques and Applications & Advanced Measurement and Metrology Techniques & Electron and X-Ray Spectroscopy Techniques. The author has an h-index of 16, co-authored 51 publications.

ORCID: 0000-0002-2531-1820

Research Topics

Force Microscopy Techniques and ApplicationsAdvanced Measurement and Metrology TechniquesElectron and X-Ray Spectroscopy TechniquesSurface Roughness and Optical MeasurementsIntegrated Circuits and Semiconductor Failure Analysis

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