An efficient and scale-aware zero-shot industrial anomaly detection technique based on optimized CLIP
2025 · Measurement · 3 citations
https://doi.org/10.1016/j.measurement.2025.117443
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35
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554
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14
h-index
17
i10-index
Shuang Mei is an academic researcher from National University of Defense Technology. The author has contributed to research in topics: Industrial Vision Systems and Defect Detection & Integrated Circuits and Semiconductor Failure Analysis & Infrastructure Maintenance and Monitoring. The author has an h-index of 14, co-authored 30 publications.
ORCID: 0000-0002-3252-3522https://doi.org/10.1016/j.measurement.2025.117443
https://doi.org/10.1016/j.atmosres.2025.108383
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