https://doi.org/10.1016/j.cirp.2015.05.009
Wei Gao
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768
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9.6K
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49
h-index
192
i10-index
Wei Gao is an academic researcher from Hong Kong Polytechnic University. The author has contributed to research in topics: Advanced Measurement and Metrology Techniques & Advanced Surface Polishing Techniques & Surface Roughness and Optical Measurements. The author has an h-index of 49, co-authored 653 publications.
ORCID: 0000-0001-9336-2729Papers by this author
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