Quantifying charge carrier concentration in ZnO thin films by Scanning Kelvin Probe Microscopy
2014 · Scientific Reports · 114 citations
https://doi.org/10.1038/srep04203
IMEC(BE)
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217
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h-index
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i10-index
Marcus S. Dahlem is an academic researcher from IMEC. The author has contributed to research in topics: Photonic and Optical Devices & Advanced Fiber Laser Technologies & Stellar, planetary, and galactic studies. The author has an h-index of 26, co-authored 185 publications.
ORCID: 0000-0002-1373-6709https://doi.org/10.1038/srep04203
https://doi.org/10.1364/ol.402446
https://doi.org/10.1117/12.3039758
https://doi.org/10.1117/12.3041911
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