Detection limit of defect-induced strain in GaN evaluated by valence EELS and correlated structural analysis
2025 · Microscopy · 1 citations
https://doi.org/10.1093/jmicro/dfaf034
Sony (Taiwan)(TW)
Claim or correct this author profile
Claim this profile or suggest corrections to the name, affiliation, bio, photo, or paper titles. Approved changes appear as verified CitedEvidence overlays.
3
Papers
15
Citations
2
h-index
1
i10-index
Susumu Kusanagi is an academic researcher from Sony (Taiwan). The author has contributed to research in topics: Semiconductor Lasers and Optical Devices & GaN-based semiconductor devices and materials & Photonic and Optical Devices. The author has an h-index of 2, co-authored 3 publications.
Click to start Chat