A machine learning approach to accelerate reliability prediction in nanowire FETs from self-heating perspective
2024 · Microelectronics Reliability · 1 citations
https://doi.org/10.1016/j.microrel.2024.115484
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Pramod Kumar Tiwari is an academic researcher from Indian Institute of Technology Patna. The author has contributed to research in topics: Advancements in Semiconductor Devices and Circuit Design & Semiconductor materials and devices & Silicon Carbide Semiconductor Technologies. The author has an h-index of 20, co-authored 125 publications.
ORCID: 0000-0001-5640-3747https://doi.org/10.1016/j.microrel.2024.115484
https://doi.org/10.1016/j.micrna.2025.208443
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