STRUCTURAL ANALYSIS BY X‐RAY INTENSITY ANGULAR CROSS CORRELATIONS
2016 · Advances in chemical physics · 22 citations
https://doi.org/10.1002/9781119290971.ch1
Claim or correct this author profile
Claim this profile or suggest corrections to the name, affiliation, bio, photo, or paper titles. Approved changes appear as verified CitedEvidence overlays.
188
Papers
9.6K
Citations
47
h-index
104
i10-index
M. Altarelli is an academic researcher. The author has contributed to research in topics: Semiconductor Quantum Structures and Devices & Quantum and electron transport phenomena & Surface and Thin Film Phenomena. The author has an h-index of 47, co-authored 160 publications.
ORCID: 0000-0002-2980-8535https://doi.org/10.1002/9781119290971.ch1
https://doi.org/10.1140/epjs/s11734-024-01164-9
Click to start Chat