The influence of visible light on the gate bias instability of In–Ga–Zn–O thin film transistors
2011 · Solid-State Electronics · 33 citations
https://doi.org/10.1016/j.sse.2011.04.014
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44
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28
h-index
37
i10-index
Changjung Kim is an academic researcher from Samsung (South Korea). The author has contributed to research in topics: Thin-Film Transistor Technologies & ZnO doping and properties & Semiconductor materials and devices. The author has an h-index of 28, co-authored 38 publications.
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