Fourier ellipsometry – an ellipsometric approach to Fourier scatterometry
2015 · Journal of the European Optical Society Rapid Publications · 16 citations
https://doi.org/10.2971/jeos.2015.15002
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22
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157
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6
h-index
5
i10-index
M. Fried is an academic researcher from Institute for Technical Physics and Materials Science. The author has contributed to research in topics: ZnO doping and properties & Semiconductor materials and devices & Thin-Film Transistor Technologies. The author has an h-index of 6, co-authored 19 publications.
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