Comprehensive analysis of MOSFET threshold voltage extraction method considering DIBL effect from 300 K down to 10 K
2024 · Solid-State Electronics · 3 citations
https://doi.org/10.1016/j.sse.2024.109045
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Hao Su is an academic researcher from University of Macau. The author has contributed to research in topics: Advancements in Semiconductor Devices and Circuit Design & Semiconductor materials and devices & Silicon Carbide Semiconductor Technologies. The author has an h-index of 3, co-authored 11 publications.
ORCID: 0000-0002-2444-7128Click to start Chat