Highly accurate differential dual-probe thickness measurement method based on spectral interferometry for opaque samples
2025 · Optics & Laser Technology · 0 citations
https://doi.org/10.1016/j.optlastec.2025.113048
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Yifu Wan is an academic researcher from Tianjin University. The author has contributed to research in topics: Optical measurement and interference techniques & Advanced Measurement and Metrology Techniques & Advanced Fiber Optic Sensors. The author has an h-index of 1, co-authored 5 publications.
ORCID: 0000-0001-9004-0732https://doi.org/10.1016/j.optlastec.2025.113048
https://doi.org/10.1109/lpt.2025.3642855
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