Helicon-excited electron paramagnetic resonance in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">Hg</mml:mi></mml:mrow><mml:mrow><mml:mn>1</mml:mn><mml:mi mathvariant="normal">−</mml:mi><mml:mi mathvariant="normal">x</mml:mi></mml:mrow></mml:msub></mml:mrow></mml:math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">Mn</mml:mi></mml:mrow><mml:mrow><mml:mi mathvariant="normal">x</mml:mi></mml:mrow></mml:msub></mml:mrow></mml:math>Se

TL;DRAbstract

We have used the techniques of microwave helicon transmission and helicon-excited electron paramagnetic resonance to study the behavior of the dynamic magnetic susceptibility in ${\mathrm{Hg}}_{1\mathrm{\ensuremath{-}}\mathrm{x}}$${\mathrm{Mn}}_{\mathrm{x}}$Se. The samples studied had manganese concentrations ranging from x=0 to x=0.09. This 9 at. % concentration forms an upper limit for the usefulness of the helicon technique. For low manganese concentrations (x0.005), the EPR line is characterized by six hyperfine-split peaks, which yield a value of 60 G for the hyperfine splitting constant. As the amount of manganese is increased above 0.5 at. %, the six lines coalesce into a single broad peak, both the strength and width of which depend on the temperature and composition of the sample.

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