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高摻雜之二氧化錫薄膜能隙窄化現象及氧化銦薄膜之應力量測與探討; Bandgap Narrowing in High Dopant Tin Oxide and Stress Measurement of Flexible ITO Thin Film

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Keywords

DopantMaterials scienceStress (linguistics)TinTin oxideThin filmBand gapOptoelectronics

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