宮

宮岡裕子

Claim or correct this author profile

Claim this profile or suggest corrections to the name, affiliation, bio, photo, or paper titles. Approved changes appear as verified CitedEvidence overlays.

Papers

Citations

h-index

i10-index

宮岡裕子 is an academic researcher. The author has contributed to research in topics: Non-Destructive Testing Techniques & Integrated Circuits and Semiconductor Failure Analysis.