Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x rays
1999 · Applied Physics Letters · 1,037 citations
https://doi.org/10.1063/1.125225
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349
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37
h-index
131
i10-index
J. Van Landuyt is an academic researcher. The author has contributed to research in topics: Electron and X-Ray Spectroscopy Techniques & Semiconductor materials and interfaces & Advanced Materials Characterization Techniques. The author has an h-index of 37, co-authored 297 publications.
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