Process variation dependence of total ionizing dose effects in bulk nFinFETs
2018 · Microelectronics Reliability · 10 citations
https://doi.org/10.1016/j.microrel.2018.07.020
H
H. Yin
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H. Yin is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Advancements in Semiconductor Devices and Circuit Design & Thin-Film Transistor Technologies & Semiconductor materials and devices. The author has an h-index of 11, co-authored 29 publications.
ORCID: 0009-0001-8358-0084Papers by this author
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