VLSI and Analog Circuit Testing
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4
Papers
15
Citations
2
h-index
1
i10-index
Y. Hayasaka is an academic researcher from Mitsubishi Electric (Japan). The author has contributed to research in topics: VLSI and Analog Circuit Testing & Software Testing and Debugging Techniques & Integrated Circuits and Semiconductor Failure Analysis. The author has an h-index of 2, co-authored 4 publications.
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