VLSI and Analog Circuit Testing
1 works
T
T. Furutani
Hitachi (Japan)(JP)
Claim or correct this author profile
Claim this profile or suggest corrections to the name, affiliation, bio, photo, or paper titles. Approved changes appear as verified CitedEvidence overlays.
1
Papers
8
Citations
1
h-index
0
i10-index
T. Furutani is an academic researcher from Hitachi (Japan). The author has contributed to research in topics: VLSI and Analog Circuit Testing & Industrial Vision Systems and Defect Detection & Integrated Circuits and Semiconductor Failure Analysis. The author has an h-index of 1, co-authored 1 publications.
Research topics
topicsChat about Author
Papers
Chat
Click to start Chat